Superconductor Art Gallery: 2d Images Page 1
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False color fractograph of OI-ST MJR Nb3Sn filaments. The Nb3Sn grains fracture at their grain boundaries,
providing the contrast required to analyze their size and
distribution. The remaining unreacted Nb islands (this strand
is only partially reacted) are pulled up into ridges by the
fracture process. The original FESEM image has been tinted
to make it more dramatic. A similar cross-section is shown
in the next page but is in the form of a 3-d anaglyph image. Unreacted strand supplied to the UW by Oxford Instruments
Inc. - Superconducting Technology, Carteret, NJ.
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False
color fractograph of SMI PIT Nb3Sn A15 layer. FESEM image colored for effect (a rejected image for the annual
ASC Holiday/New Year card). Unreacted strand supplied to
the UW by Shapemetal Innovation B. V., Enschede, The Netherlands.
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False
color image of filaments in polished cross-section of Furukawa
ITER Nb3Sn strand. Note the exceptional uniformity
and the barely discernable extra spacing between the original
bundles of 19 filaments.
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Another
false color variant on the Furukawa ITER strand. The unreacted
Nb cores (green) are more visible here. FESEM image.
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False
color images of Nb3Sn filament extracted for IGC-AS
ITER strand. FESEM image. The filament as approximately
1/25 the thickness of a sheet of paper.
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13 µm diameter NbTiTa filaments etched out of IGC-AS
Nb-Ti-Ta strand for FNAL-LHC IR Quads. FESEM.
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Montage showing design of IGC-AS high J<sub>c</sub> (critical current density) internal Sn strand. Heat treated
strand supplied to the UW by IGC-Advanced Superconductors, Waterbury,
CT.
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Deep etch of IGC-AS internal Sn strand (Cu removed by etch).
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False color FESEM image of deep-etch IGC-AS Nb3Sn
strand.
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A windows background image showing Nb3Sn filaments
exposed by deep Cu etch.
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All the ASC source photographs on this website are copyrighted and may not be used without the express permission of the © holders.
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