Fractured surface from LaFeAs-OF sample imaged using a laser scanning confocal image (LSCM). A white light (LED source) image is used to color a higher resolution scanning laser generated image. The fracture image is used to reveal the existence of multiple phases as well as the grain size. The LSCM also provides volumetric data on the sample that is used in conjunction with electrical measurements made at the Applied Superconductivity Center and NHMFL. The Polycrystalline LaFeAsO0.89F0.11 samples were made by solid state synthesis at ORNL: Sefat, A. S. et al. Electron correlations in the superconductor LaFeAsO0.89F0.11 with low carrier density. Phys. Rev. B 77 174503 (2008).

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The final image was used to create the cover art for the Oct 20th 2008 issue of Chemical Engineering News.